Publication detail
| Reference | IEC 61445 ed1.0 |
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| Title | Digital Test Interchange Format (DTIF) | |||||||||
| Publication date | 2012-06-21 | |||||||||
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| Abstract | IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe. |
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| Technical Committee | 91 - Electronics assembly technology
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| Stability date | 2015 | |||||||||
| Work in progress |
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