IEC 62969-4:2018
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
Abstract
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2018-06-18 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.99 - Other semiconductor devices |
Stability date | 2026 |
Pages | 39 |
File size | 1434 KB |
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