| Reference |
IEC 60747-11 ed1.0 withdrawn corrigendum |
 > preview
|
| Title |
Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devices
|
| Publication date |
1985-01-01 |
Format, price (Swiss francs) and language |
 | 80.- |
| 35 pages |  | 80.- |
| 1288 Kb |
|
| |
| Abstract |
Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.
|
| Technical Committee |
47E - Discrete semiconductor devices
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| ICS Codes |
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| |
| Replaced by |
|
| Stability date |
2015 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|