International Electrotechnical Commission

Publication detail

Reference	IEC 60748-20-1 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
Publication date	1994-03-01
Format, price (Swiss francs) and language	170.- 55 pages 170.- 1894 Kb
Abstract	The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.
Technical Committee	47A - Integrated circuits
ICS Codes	31.200 Integrated circuits. Microelectronics *Including electronic chips, logical and analogue microstructures *Microprocessors, see 35.160
Replaced by
Stability date	2017
Work in progress	Project Stage code Forecast publication date No project under development - -

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