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Publication detail

 
Reference IEC 60759 ed1.0 withdrawn corrigendum
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Title Standard test procedures for semiconductor X-ray energy spectrometers
Publication date 1983-01-01
Format, price
(Swiss francs)
and language
230.- 97 pages
230.- 4191 Kb
 
Abstract Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
Technical Committee 45 - Nuclear instrumentation  RSS
ICS Codes
17.240 Radiation measurements
*Including dosimetry
*Radiation protection, see 13.280
 
Replaced by
Stability date 2013
 
Work in progress
ProjectStage codeForecast publication date
No project under development--

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