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Publication detail

 
Reference IEC/PAS 62162 ed1.0 withdrawn corrigendum
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Title Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Publication date 2000-08-22
Format, price
(Swiss francs)
and language
25.- 7 pages
25.- 178 Kb
 
Abstract Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080.01 Semiconductor devices in general
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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