International Electrotechnical Commission

Publication detail

Reference	IEC/PAS 62162 ed1.0 withdrawn corrigendum	> preview
Title	Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Publication date	2000-08-22
Format, price (Swiss francs) and language	25.- 7 pages 25.- 178 Kb
Abstract	Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

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