International Electrotechnical Commission

Publication detail

Reference	IEC 60749-4 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Publication date	2002-04-12
Format, price (Swiss francs) and language	30.- 15 pages 30.- 484 Kb
Abstract	Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

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