| Reference |
IEC 61967-6 ed1.0 withdrawn corrigendum |
> preview
|
| Title |
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
|
| Publication date |
2002-06-25 |
Format, price
(Swiss francs)
and language |
 | 170.- |
| 51 pages |  | 170.- |
| 656 Kb |
|
| |
| Abstract |
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
The contents of the corrigendum of August 2010 have been included in this copy.
|
| Technical Committee |
47A - Integrated circuits
|
| ICS Codes |
| 31.200 |
Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160 |
|
| |
| Replaced by |
|
| Stability date |
2018 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|
Search
Quick access by ref. number
Basket
Payment
Just Published
Bestsellers