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Publication detail

 
Reference IEC 61967-6 ed1.0 withdrawn corrigendum
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Title Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Publication date 2002-06-25
Format, price
(Swiss francs)
and language
170.- 51 pages
170.- 656 Kb
 
Abstract Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.
Technical Committee 47A - Integrated circuits  RSS
ICS Codes
31.200 Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160
 
Replaced by
Stability date 2018
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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