International Electrotechnical Commission

Publication detail

Reference	IEC 60749-31 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Publication date	2002-08-30
Format, price (Swiss francs) and language	18.- 9 pages 18.- 286 Kb
Abstract	Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

Search

>> Advanced search

Quick access by ref. number

Basket

Your basket is empty

Your country is :
Your TVA is : You must login...

Payment

Just Published

1. IEC 61970-301 Ed. 4.0
2. IEC 61996-1 Ed. 2.0
3. IEC 60974-5 Ed. 3.0
4. IEC 60601-1-SER Ed. 1.0
5. IEC 60601-1 Ed. 3.0
6. IEC 60838-2-1-am2 Ed. 1.0
7. IEC/TS 62720 Ed. 1.0

>> Published in the last 30 days

Bestsellers

1. IEC 61000-4-2 Ed. 2.0
2. IEC 62471 Ed. 1.0
3. IEC 60068-2-14 Ed. 6.0
4. IEC 60079-0 Ed. 6.0
5. IEC 61010-1 Ed. 3.0
6. IEC 61400-12-2 Ed. 1.0
7. IEC 62304 Ed. 1.0
8. IEC 60229 Ed. 3.0
9. IEC 60812 Ed. 2.0
10. IEC 61326-1 Ed. 2.0