International Electrotechnical Commission

Publication detail

Reference	IEC 60749-18 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Publication date	2002-12-13
Format, price (Swiss francs) and language	60.- 27 pages 60.- 453 Kb
Abstract	Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

Search

>> Advanced search

Quick access by ref. number

Basket

Your basket is empty

Your country is :
Your TVA is : You must login...

Payment

Just Published

1. IEC 61970-301 Ed. 4.0
2. IEC 61996-1 Ed. 2.0
3. IEC 60974-5 Ed. 3.0
4. IEC 60601-1-SER Ed. 1.0
5. IEC 60601-1 Ed. 3.0
6. IEC 60838-2-1-am2 Ed. 1.0
7. IEC/TS 62720 Ed. 1.0

>> Published in the last 30 days

Bestsellers

1. IEC 61000-4-2 Ed. 2.0
2. IEC 62304 Ed. 1.0
3. IEC 62471 Ed. 1.0
4. IEC 60068-2-14 Ed. 6.0
5. IEC 60079-0 Ed. 6.0
6. IEC 61010-1 Ed. 3.0
7. IEC 61400-12-2 Ed. 1.0
8. IEC 60068-2-78 Ed. 2.0
9. IEC 60229 Ed. 3.0
10. IEC 61326-1 Ed. 2.0