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Publication detail

 
Reference IEC 60749-5 ed1.0 withdrawn corrigendum
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Title Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Publication date 2003-01-17
Format, price
(Swiss francs)
and language
25.- 13 pages
25.- 298 Kb
 
Abstract Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080.01 Semiconductor devices in general
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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