International Electrotechnical Commission

Publication detail

Reference	IEC 60749-5 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Publication date	2003-01-17
Format, price (Swiss francs) and language	25.- 13 pages 25.- 242 Kb
Abstract	Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

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