International Electrotechnical Commission

Publication detail

Reference	IEC 60749-17 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Publication date	2003-02-20
Format, price (Swiss francs) and language	20.- 11 pages 20.- 323 Kb
Abstract	Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

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