International Electrotechnical Commission

Publication detail

Reference	IEC 60749-11 ed1.0 withdrawn corrigendum	no preview
Title	Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Publication date	2003-08-13
Download	Free download or Buy base publication
Abstract	Modification of the validity date: now put at 2007.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

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