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Reference IEC 60749-11 ed1.0 withdrawn corrigendum

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Title Versión Oficial En español (Incluye el Corrigendum 1 de enero de 2003) Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 11: Variaciones rápidas de temperatura. Método de los dos baños.
Publication date 2002-04-12
Format, price
(Swiss francs)
and language
25.- 13 pages
25.- 50 Kb
 
Abstract Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080.01 Semiconductor devices in general
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
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