Publication detail
| Reference | IEC 60749-11 ed1.0 |
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| Title | Versión Oficial En español (Incluye el Corrigendum 1 de enero de 2003) Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 11: Variaciones rápidas de temperatura. Método de los dos baños. | |||||||||
| Publication date | 2002-04-12 | |||||||||
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| Abstract | Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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