Publication detail
| Reference | IEC 60749-12 ed1.0 |
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| Title | Versión Oficial En español - Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 12: Vibraciones, frecuencias variables. | |||||||||
| Publication date | 2002-04-30 | |||||||||
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| Abstract | Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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