Publication detail
| Reference | IEC 60749-4 ed1.0 |
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| Title | Versión Oficial En español - Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 4: Ensayo continuo fuertemente acelerado de esfuerzo de calor húmedo (HAST). | |||||||||
| Publication date | 2002-04-12 | |||||||||
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| Abstract | Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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