International Electrotechnical Commission

Publication detail

Reference	IEC 60749-23 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Publication date	2004-02-23
Format, price (Swiss francs) and language	35.- 17 pages 35.- 388 Kb
Abstract	This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080.01 Semiconductor devices in general
Replaced by
Stability date	2015
Work in progress	Project Stage code Forecast publication date No project under development - -

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