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Publication detail

 
Reference IEC 60749-24 ed1.0 withdrawn corrigendum
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Title Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Publication date 2004-03-09
Format, price
(Swiss francs)
and language
40.- 7 pages
40.- 273 Kb
 
Abstract The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080 Semiconductor devices
*Semiconducting materials, see 29.045
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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