International Electrotechnical Commission

Publication detail

Reference	IEC 61164 ed2.0 withdrawn corrigendum	> preview
Title	Reliability growth - Statistical test and estimation methods
Publication date	2004-03-24
Format, price (Swiss francs) and language	250.- 55 pages 250.- 807 Kb
Abstract	Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
Technical Committee	56 - Dependability
ICS Codes	03.120.01 Quality in general *Including general aspects related to reliability and maintainability 03.120.30 Application of statistical methods
Replaced by
Stability date	2014
Work in progress	Project Stage code Forecast publication date No project under development - -

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