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Reference IEC 60749-32 ed1.0 withdrawn corrigendum

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Title Versión oficial en español - (incluye corrigendum 1:2003) Dispositivos de semiconductores - Métodos de ensayo mecánicos y climáticos - Parte 32: Inflamabilidad de dispositivos con encapsulado plástico (provocada externamente)
Publication date 2002-08-30
Format, price
(Swiss francs)
and language
18.- 6 pages
18.- 111 Kb
 
Abstract Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080.01 Semiconductor devices in general
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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