Publication detail
| Reference | IEC 60749-31 ed1.0 |
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| Title | Versión oficial en español - (incluye corrigendum 1:2003) Dispositivos de semiconductores - Métodos de ensayo mecánicos y climáticos - Parte 31: Inflamabilidad de dispositivos con encapsulado plástico (provocada internamente) | |||||||||
| Publication date | 2002-08-30 | |||||||||
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| Abstract | Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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