Publication detail
| Reference | IEC 60749-36 ed1.0 |
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| Title | Versión oficial en español - Dispositivos de semiconductores - Métodos de ensayo mecánicos y climáticos - Parte 36: Aceleración constante | |||||||||
| Publication date | 2003-02-13 | |||||||||
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| Abstract | Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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