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Reference IEC 60749-1 ed1.0 withdrawn corrigendum

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Title Versión Oficial En español (Incluye el Corrigendum1 de agosto de 2003) Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 1: Generalidades.
Publication date 2002-08-30
Format, price
(Swiss francs)
and language
30.- 15 pages
30.- 126 Kb
 
Abstract Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080.01 Semiconductor devices in general
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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