Publication detail
| Reference | IEC 60749-23 ed1.0 |
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| Title | Versión Oficial En español - Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura. | |||||||||
| Publication date | 2004-02-23 | |||||||||
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| Abstract | This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2015 | |||||||||
| Work in progress |
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