Publication detail
| Reference | IEC 60749-24 ed1.0 |
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| Title | Versión Oficial En español - Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 24: Resistencia a la humedad acelerada. HAST no polarizado. | |||||||||
| Publication date | 2004-03-09 | |||||||||
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| Abstract | The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it. | |||||||||
| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2016 | |||||||||
| Work in progress |
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