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Reference IEC 60749-33 ed1.0 withdrawn corrigendum

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Title Versión Oficial En español - Dispositivos semiconductores. Ensayos mecánicos y climáticos. Parte 33: Resistencia a la humedad acelerada. Autoclave no polarizada
Publication date 2004-03-09
Format, price
(Swiss francs)
and language
20.- 6 pages
20.- 132 Kb
 
Abstract The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080 Semiconductor devices
*Semiconducting materials, see 29.045
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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