International Electrotechnical Commission

Publication detail

Reference	IEC 60749-24 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Publication date	2004-03-09
Format, price (Swiss francs) and language	40.- 19 pages 40.- 901 Kb
Abstract	The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080 Semiconductor devices *Semiconducting materials, see 29.045
Replaced by
Stability date	2016
Work in progress	Project Stage code Forecast publication date No project under development - -

Search

>> Advanced search

Quick access by ref. number

Basket

Your basket is empty

Your country is :
Your TVA is : You must login...

Payment

Just Published

1. IEC 62321-1 Ed. 1.0
2. IEC 61300-3-50 Ed. 1.0
3. IEC 60286-3 Ed. 5.0
4. IEC/TR 62547 Ed. 2.0
5. IEC 60598-2-11 Ed. 2.0
6. IEC 62056-7-6 Ed. 1.0
7. IEC 62056-8-3 Ed. 1.0

>> Published in the last 30 days

Bestsellers

1. IEC 61010-1 Ed. 3.0
2. IEC 62304 Ed. 1.0
3. IEC 61000-4-2 Ed. 2.0
4. IEC 62471 Ed. 1.0
5. IEC 60079-0 Ed. 6.0
6. IEC 60812 Ed. 2.0
7. IEC 61400-12-2 Ed. 1.0
8. IEC 62304 Ed. 1.0
9. IEC 60529 Ed. 2.1
10. IEC 60601-1 Ed. 3.1