International Electrotechnical Commission

Publication detail

Reference	IEC 62373 ed1.0 withdrawn corrigendum	> preview
Title	Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Publication date	2006-07-18
Format, price (Swiss francs) and language	60.- 27 pages 60.- 547 Kb
Abstract	Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080 Semiconductor devices *Semiconducting materials, see 29.045
Replaced by
Stability date	2014
Work in progress	Project Stage code Forecast publication date No project under development - -

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