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Publication detail

 
Reference IEC 62373 ed1.0 withdrawn corrigendum
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Title Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Publication date 2006-07-18
Format, price
(Swiss francs)
and language
60.- 27 pages
60.- 547 Kb
 
Abstract Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080 Semiconductor devices
*Semiconducting materials, see 29.045
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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