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Reference IEC 61967-4 ed1.1 Consol. with am1 withdrawn corrigendum
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Title Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
Publication date 2006-07-27
Format, price
(Swiss francs)
and language
240.- 65 pages
240.- 2511 Kb
 
Abstract Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
Technical Committee 47A - Integrated circuits  RSS
ICS Codes
31.200 Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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