| Reference |
IEC 61967-4 ed1.1 Consol. with am1 withdrawn corrigendum |
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|
| Title |
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
|
| Publication date |
2006-07-27 |
Format, price
(Swiss francs)
and language |
 | 240.- |
| 65 pages |  | 240.- |
| 2511 Kb |
|
| |
| Abstract |
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.
This consolidated version consists of the first edition (2002)
and its amendment 1 (2006). Therefore, no need to order amendment in
addition to this publication.
|
| Technical Committee |
47A - Integrated circuits
|
| ICS Codes |
| 31.200 |
Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160 |
|
| |
| Replaced by |
|
| Stability date |
2015 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|
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