International Electrotechnical Commission

Publication detail

Reference	IEC 62374 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Publication date	2007-03-29
Format, price (Swiss francs) and language	130.- 43 pages 130.- 735 Kb
Abstract	Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080 Semiconductor devices *Semiconducting materials, see 29.045
Replaced by
Stability date	2014
Work in progress	Project Stage code Forecast publication date No project under development - -

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