| Reference |
IEC 60068-2-82 ed1.0 withdrawn corrigendum |
 > preview
|
| Title |
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components
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| Publication date |
2007-05-23 |
Format, price (Swiss francs) and language |
 | 190.- |
| 32 pages |  | 190.- |
| 2460 Kb |
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| |
| Abstract |
Specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, it does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria.
Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.
The contents of the corrigendum of December 2009 have been included in this copy.
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| Technical Committee |
91 - Electronics assembly technology
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| ICS Codes |
| 19.040 |
Environmental testing
*Including testing equipment
|
| 31.190 |
Electronic component assemblies
*Including preassembled modules |
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| Replaced by |
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| Stability date |
2015 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|