International Electrotechnical Commission

Publication detail

Reference	IEC 62132-3 ed1.0 withdrawn corrigendum	> preview
Title	Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Publication date	2007-09-26
Format, price (Swiss francs) and language	100.- 37 pages 100.- 1068 Kb
Abstract	This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.
Technical Committee	47A - Integrated circuits
ICS Codes	31.200 Integrated circuits. Microelectronics *Including electronic chips, logical and analogue microstructures *Microprocessors, see 35.160
Replaced by
Stability date	2015
Work in progress	Project Stage code Forecast publication date No project under development - -

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