| Reference |
IEC 62527 ed1.0 withdrawn corrigendum |
 > preview
|
| Title |
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
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| Publication date |
2007-11-07 |
Format, price (Swiss francs) and language |
 | 210.- |
| 39 pages |  | 210.- |
| 1098 Kb |
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| Abstract |
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
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| Technical Committee |
91 - Electronics assembly technology
|
| ICS Codes |
| 25.040 |
Industrial automation systems
*IT applications in industry, see 35.240.50 |
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| Replaced by |
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| Stability date |
2014 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
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