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Publication detail

 
Reference IEC 62526 ed1.0 withdrawn corrigendum
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Title Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Publication date 2007-11-07
Format, price
(Swiss francs)
and language
320.- 123 pages
320.- 1588 Kb
 
Abstract Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Technical Committee 91 - Electronics assembly technology  RSS
ICS Codes
25.040 Industrial automation systems
*IT applications in industry, see 35.240.50
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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