International Electrotechnical Commission

Publication detail

Reference	IEC 62526 ed1.0 withdrawn corrigendum	> preview
Title	Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Publication date	2007-11-07
Format, price (Swiss francs) and language	320.- 123 pages 320.- 1588 Kb
Abstract	Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Technical Committee	91 - Electronics assembly technology
ICS Codes	25.040 Industrial automation systems *IT applications in industry, see 35.240.50
Replaced by
Stability date	2015
Work in progress	Project Stage code Forecast publication date No project under development - -

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