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Publication detail

 
Reference IEC 62525 ed1.0 withdrawn corrigendum
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Title Standard Test Interface Language (STIL) for Digital Test Vector Data
Publication date 2007-11-07
Format, price
(Swiss francs)
and language
330.- 143 pages
330.- 1302 Kb
 
Abstract Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
Technical Committee 91 - Electronics assembly technology  RSS
ICS Codes
25.040 Industrial automation systems
*IT applications in industry, see 35.240.50

19.080 Electrical and electronic testing
*Including testing equipment
*Equipment for measuring electrical and magnetic quantities, see 17.220.20
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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