International Electrotechnical Commission

Publication detail

Reference	IEC 62525 ed1.0 withdrawn corrigendum	> preview
Title	Standard Test Interface Language (STIL) for Digital Test Vector Data
Publication date	2007-11-07
Format, price (Swiss francs) and language	330.- 143 pages 330.- 1302 Kb
Abstract	Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
Technical Committee	91 - Electronics assembly technology
ICS Codes	25.040 Industrial automation systems *IT applications in industry, see 35.240.50 19.080 Electrical and electronic testing *Including testing equipment *Equipment for measuring electrical and magnetic quantities, see 17.220.20
Replaced by
Stability date	2015
Work in progress	Project Stage code Forecast publication date No project under development - -

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