International Electrotechnical Commission

Publication detail

Reference	IEC 60747-5-3 ed1.1 Consol. with am1 withdrawn corrigendum	> preview
Title	Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Publication date	2009-11-25
Format, price (Swiss francs) and language	280.- 86 pages 280.- 1678 Kb
Abstract	IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication. This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
Technical Committee	47E - Discrete semiconductor devices
ICS Codes	31.080.99 Other semiconductor devices
Replaced by
Stability date	2013
Work in progress	Project Stage code Forecast publication date No project under development - -

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