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Reference IEC 60747-5-3 ed1.1 Consol. with am1 withdrawn corrigendum
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Title Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Publication date 2009-11-25
Format, price
(Swiss francs)
and language
280.- 86 pages
280.- 1678 Kb
 
Abstract IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (2002). Therefore, no need to order amendment in addition to this publication.

This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
Technical Committee 47E - Discrete semiconductor devices  RSS
ICS Codes
31.080.99 Other semiconductor devices
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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