|Reference||IEC 60747-1 ed2.0 withdrawn corrigendum||
|Title||Semiconductor devices - Part 1: General|
|Abstract||IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below:
a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted.
b) There has been a general revision of guidance on essential ratings and characteristics.
c) The distinction between general and reference methods of measurement has been removed.
d) A clause on product discontinuation notice has been added.
|Technical Committee||47 - Semiconductor devices|
|Work in progress||
Quick access by ref. number
|Your basket is empty|
|Accepted credit cards:|
|Prices in CHF (Swiss francs)|
|Request a pro forma to pay by bank transfer or cheque|
|Learn how to share your publications with your colleagues, using networking options|
- IEC 82045-2 Ed. 1.0
- IEC/TR 62907 Ed. 1.0
- IEC/TR 60068-3-12 Ed. 2.0
- IEC 60704-2-5-am1 Ed. 2.0
- IEC 60684-3-285 Ed. 1.0
- IEC 60115-8-1 Ed. 2.0
- IEC 60704-2-5 Ed. 2.1