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Publication detail

 
Reference IEC 62416 ed1.0 withdrawn corrigendum
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Title Semiconductor devices - Hot carrier test on MOS transistors
Publication date 2010-04-26
Format, price
(Swiss francs)
and language
40.- 20 pages
40.- 925 Kb
 
Abstract IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Technical Committee 47 - Semiconductor devices  RSS
ICS Codes
31.080 Semiconductor devices
*Semiconducting materials, see 29.045
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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