International Electrotechnical Commission

Publication detail

Reference	IEC 62416 ed1.0 withdrawn corrigendum	> preview
Title	Semiconductor devices - Hot carrier test on MOS transistors
Publication date	2010-04-26
Format, price (Swiss francs) and language	40.- 20 pages 40.- 925 Kb
Abstract	IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Technical Committee	47 - Semiconductor devices
ICS Codes	31.080 Semiconductor devices *Semiconducting materials, see 29.045
Replaced by
Stability date	2015
Work in progress	Project Stage code Forecast publication date No project under development - -

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