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Reference IEC/TR 61967-1-1 ed1.0 withdrawn corrigendum
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Title Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
Publication date 2010-05-11
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250.- 103 pages
250.- 1293 Kb
Abstract IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission, immunity and impulse immunity near-field scan data in the frequency and time domains. The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
This publication contains colours which are considered to be useful for the correct understanding of its contents.
Technical Committee 47A - Integrated circuits  RSS
ICS Codes
31.200 Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160
Replaced by
Stability date 2015
Work in progress
ProjectStage codeForecast publication date
IEC/TR 61967-1-1 Ed.2  CDTR2015-10-27


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