| Reference |
IEC/TR 61967-1-1 ed1.0 withdrawn corrigendum |
> preview
|
| Title |
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
|
| Publication date |
2010-05-11 |
Format, price
(Swiss francs)
and language |
 | 250.- |
| 103 pages |  | 250.- |
| 1293 Kb |
|
| |
| Abstract |
IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission, immunity and impulse immunity near-field scan data in the frequency and time domains. The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
This publication contains colours which are considered to be
useful for the correct understanding of its contents.
|
| Technical Committee |
47A - Integrated circuits
|
| ICS Codes |
| 31.200 |
Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160 |
|
| |
| Replaced by |
|
| Stability date |
2014 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|
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