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Reference IEC 61967-6 ed1.0 withdrawn corrigendum

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Title Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Publication date 2010-08-30
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Abstract
Technical Committee 47A - Integrated circuits  RSS
ICS Codes
31.200 Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160
 
Replaced by
Stability date 2018
 
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