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Reference IEC 60679-6 ed1.0 withdrawn corrigendum
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Title Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Publication date 2011-03-14
Format, price
(Swiss francs)
and language
130.- 42 pages
130.- 1337 Kb
 
Abstract IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.
Technical Committee 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection  RSS
ICS Codes
31.140 Piezoelectric devices
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
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