Publication detail
| Reference | IEC 60749-29 ed2.0 |
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| Title | Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test | |||||||||
| Publication date | 2011-04-07 | |||||||||
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| Abstract | IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations. |
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| Technical Committee | 47 - Semiconductor devices
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| Stability date | 2015 | |||||||||
| Work in progress |
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