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Reference IEC 61445 ed1.0 withdrawn corrigendum
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Title Digital Test Interchange Format (DTIF)
Publication date 2012-06-21
Format, price
(Swiss francs)
and language
300.- 101 pages
300.- 2848 Kb
 
Abstract IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
Technical Committee 91 - Electronics assembly technology  RSS
ICS Codes
25.040 Industrial automation systems
*IT applications in industry, see 35.240.50

35.060 Languages used in information technology
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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