| Reference |
IEC 61788-17 ed1.0 withdrawn corrigendum |
> preview
|
| Title |
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
|
| Publication date |
2013-01-16 |
Format, price
(Swiss francs)
and language |
 | 230.- |
| 93 pages |  | 230.- |
| 2726 Kb |
|
| |
| Abstract |
IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.
|
| Technical Committee |
90 - Superconductivity
|
| ICS Codes |
| 17.220.20 |
Measurement of electrical and magnetic quantities
*Including measuring instruments, instrument transformers
*Electric energy meters in buildings, see 91.140.50
|
| 29.050 |
Superconductivity and conducting materials |
|
| |
| Replaced by |
|
| Stability date |
2020 |
| |
| Work in progress |
| Project | Stage code | Forecast publication date |
|---|
| No project under development | - | - |
|
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