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Reference IEC 60444-6 ed2.0 withdrawn corrigendum
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Title Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Publication date 2013-06-19
Format, price
(Swiss francs)
and language
100.- 38 pages
100.- 1206 Kb
 
Abstract IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
Technical Committee 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection  RSS
ICS Codes
31.140 Piezoelectric devices
 
Replaced by
Stability date 2015
 
Work in progress
ProjectStage codeForecast publication date
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