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Publication detail

 
Reference IEC 62215-3 ed1.0 withdrawn corrigendum
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Title Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Publication date 2013-07-17
Format, price
(Swiss francs)
and language
190.- 66 pages
190.- 1376 Kb
 
Abstract IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Technical Committee 47A - Integrated circuits  RSS
ICS Codes
31.200 Integrated circuits. Microelectronics
*Including electronic chips, logical and analogue microstructures
*Microprocessors, see 35.160
 
Replaced by
Stability date 2016
 
Work in progress
ProjectStage codeForecast publication date
No project under development--


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