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Reference IEC 62860 ed1.0 withdrawn corrigendum
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Title Test methods for the characterization of organic transistors and materials
Publication date 2013-08-05
Format, price
(Swiss francs)
and language
150.- 23 pages
150.- 1161 Kb
 
Abstract IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
Technical Committee 113 - Nanotechnology standardization for electrical and electronic products and systems  RSS
ICS Codes
07.030 Physics. Chemistry
*This group includes standards in the field of physics and chemistry as natural sciences
*Applied physics, see 17
*Chemical technology, see 71
 
Replaced by
Stability date 2018
 
Work in progress
ProjectStage codeForecast publication date
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