IEC 60444-6 Revised
IEC 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
CHFÂ 115.-
A more recent version of this publication exists:
IEC 60444-6:2021 RLV
Technical committee
TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection| Publication type | International Standard |
| Publication date | 2013-06-19 |
| Edition | 2.0 |
| ICS | 31.140 |
| Withdrawal date | 2021-09-01 |
| ISBN number | 9782832208762 |
| Pages | 38 |
| File size | 1.19 MB |
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