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IEC 61189-3-719

IEC 61189-3-719:2016
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-719: Test methods for interconnection structures (printed boards) - Monitoring of single plated-through hole (PTH) resistance change during temperature cycling
IEC 61189-3-719:2016 specifies a test method to monitor the resistance of single plated-through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.
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Technical committee

TC 91 Electronics assembly technology

Category

Quality Assurance
Publication typeInternational Standard
Publication date2016-01-05
Edition1.0
ICS

31.180

Stability date2028
ISBN number9782832230954
Pages22
File size1.29 MB
EditionDatePublicationEditionStatus
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