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IEC 60512-6-2

IEC 60512-6-2:2002
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
BASE PUBLICATION
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Technical committee

TC 48/SC 48B Electrical connectors
Publication typeInternational Standard
Publication date2002-02-21
Edition1.0
ICS

31.220.10

Stability date2026
ISBN number2831862078
Pages9
File size303.23 KB
EditionDatePublicationEditionStatus

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